Improving Automated Test Equipment Product Life and Board Density

As semiconductors and consumer electronics become more sophisticated and complex over
time, the need to test these devices does as well. The Automated Test Equipment industry goes
to great lengths to ensure test machines and boards can last in the field over the course of
many years for a variety of devices under test. A major factor for keeping test equipment in the
field over time is designing in components that guarantee specifications over millions of cycles.
 
Additionally, with the latest trend in semiconductor test demanding more channels at higher
currents to enable the advancement of AI chipsets, board density continues to be a top priority.
Designers are looking for available options to help them downsize their boards for increasing
test capacity and capability. For over a decade OMRON has been a leader in components for
the Automated Test Equipment industry, supplying MOSFET relays and EFC Blade Pins to
improve overall product life and board density.
 
MOSFET Relays
Traditional electromechanical and reed relays utilize physical contacts which can increase
contact resistance when operated over millions of cycles. This leads to relay and test failures
and increases the amount of rework and stoppage of testing. By utilizing MOSFET relays from
OMRON, tests can be conducted with stable ON resistance over the life of the product.
OMRON's MOSFET Relays are LED operated with no physical moving contacts inside, which
allows them to maintain a stable ON resistance for millions of cycles increasing the life of a
product and keeping testing active.
 
OMRON's MOSFET relays also come in a variety of small, through hole and surface mount
packages down to 2.0 x 1.45 x 1.65mm to drastically save board space. With LED operation,
MOSFET relays provide impressive performance without needing the space typically taken by
internal contacts and coils. OMRON also offers non-leaded terminal package types to further
reduce the relay's total footprint. Selecting a MOSFET relay from OMRON can help provide
more real estate on your board for your next test.

EFC Blade Pins
Test pins commonly used in inspection equipment can provide inconsistent test reliability and
contact resistance which causes an increase in rework and downtime for testing. OMRON Blade
Pins are manufactured by utilizing its proprietary electro formed component (EFC) process
technology. With EFC, OMRON is able to produce custom pin and socket designs to provide
greater durability, reliability, and performance for a range of applications. EFC Blade pins allow
for inspection equipment to remain operational, testing more devices being manufactured, and
reducing downtime.

Webinar Summary:
Join OMRON's upcoming webinar this July to understand more on the latest signal relay and
blade pin technologies to enable the advancement of automated test equipment and the next
generation of semiconductors. We will elaborate on the current needs of the ATE market and go
in depth on the latest solutions that OMRON is releasing to meet them. Discover how these
relays and blade pins can help provide longer product life, save on board space, and improve
test reliability in your next test design. In this webinar you will learn:

• Utilize LED operated MOSFET Relays with stable ON Resistance for millions of cycles
• Incorporate a variety of small MOSFET Relay package sizes to help save board space
  and increase density
• Keep device inspection equipment running longer with high durability EFC Blade Pins

Webinar Title: Improving Automated Test Equipment Product Life and Board Density

Date: Thursday, July 18th

Time: 11:00am CST / 12:00am EST / 9:00am PST

Register Today!

Presenter: Evan Kuhn, Business Development Manager, OMRON Electronic Components

Evan Kuhn attended Northern Illinois University, where he obtained his Bachelor of Science in Electrical Engineering Technology. Starting as a Product Marketing Intern with Omron, Evan began his career in Inside Sales after school and then became the Territory Manager for the Pacific Northwest. Currently residing in Seattle, he is now Omron’s Business Development Manager for the Automated Test Equipment and AI Integration Industries.

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